RST- RAM STRESS TEST memory testing diagnostic hardware memory testing

RST RAM testing & validation hardware tool

Ultra-X, Inc., memory diagnostic hardware & RAM testing software developer & technology pioneer, offers customized solutions for pc computer memory module manufacturers, pc system builders, memory oem's, design engineers, & computer service professionals. RST PRO memory testing & validation products ensure reliability, stability, integrity, & compatibility of all memory modules utilizing over 30 proprietary memory test algorithm patterns on all: SIMMS, DIMMs, RIMMs, SO-DIMM, Micro-DIMM SDRAM 66-133, DDR, DDR/2, RDRAM (RAMBus), ECC, FB-DIMM (Fully Buffered DIMM), Registered, & Parity memory modules for all Servers, Desktops, Notebooks & Laptop PC's. Ultra-X offers full customization services to modify any RST PRO product to support specific manufacturing, validation & computer design needs. For additional information contact us at 408-261-7090 or email sales@uxd.com

RST - RAM Stress Test
RST - RAM Stress Test


Memory is one of the most notoriously difficult core system functions to troubleshoot, exercise, and validate. PC’s are not only being equipped with increasingly large amounts of RAM but their often complex system hardware and software configurations can make it even more difficult to determine if a problem is truly a RAM failure. Such problems vary with different combinations of chipsets, processors or motherboards. R.S.T. capabilities far exceed those of stand-alone testers in meeting all of these challenges.

Behavioral Testing
Many memory manufacturers first test memory chips on a traditional ATE (Automatic Test Equipment) and then assemble them into modules. Although most ATE systems are great at catching Logical and Parametric Failures, they have no reliable way of replicating Behavioral Failures. This means that it is possible for a memory module to pass through the entire test process and still fail in the field. Therefore, ATE testers do not have the best possible fault coverage.

R.S.T. identifies memory defects that may have passed every usual manufacturing test, but which can still fail in normal use. A major advantage of R.S.T. compared to stand alone testers, is the capability of testing and validating RAM within the system environment, testing for Behavioral failures that are sensitive to system idiosyncrasy. Quickly isolate intermittent failures that do not necessarily prevent a system from booting, but surface during extended testing sessions.

Small but Robust Program Size
R.S.T.’s powerful memory package is small in program size allowing the firmware to load itself into the least amount of memory possible. This allows for true low-level testing of RAM starting at memory address 2k exercising the complete range of a computer’s RAM.

Memory Test Algorithms
There are many good approaches for testing memory. However, many tests simply throw various patterns at memory without much thought or knowledge of memory architecture. As Tier 1 partners with industry leading manufacturers, Ultra-X is able to continuously develop new sophisticated proprietary memory test algorithms to locate the most evasive memory failures. R.S.T. has the broadest range of algorithms, for current and future memory chip technologies.

Self-Boot Technology
R.S.T. directly executes using Ultra-X’s exclusive Self-Boot Technology™ eliminating interference from memory drivers, TSRs, O/S limitation, and all other software layers. Utilizing direct hardware to hardware access commands, R.S.T. is able to perform true precise low-level memory testing and validation.

All of these factors make R.S.T. one of the best, accurate, and fastest ways to validate system RAM and it’s also the reason why R.S.T. successfully resolves RAM problems in many environments where standalone testers fail.

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